An extended linear hazard regression model with application to time-dependent-dielectric-breakdown of thermal oxides

We develop a generalized Extended Linear Hazard Regression (ELHR) model with linear time-varying coefficients to estimate reliability under normal operating conditions using failure time data obtained from accelerated conditions. The model considers the proportional hazards effect, time-varying coefficients effect as well as time-scale changing effect. Extensive simulation experiments demonstrate that the ELHR model provides more accurate reliability estimates than those obtained by the existing ALT models. We utilize this model to study the reliability of time-dependent-dielectric-breakdown of thermal oxides on n-type 6H-SiC using laboratory data. The results show that oxide reliability considerations effectively preclude SiC MOS devices from many high-temperature applications.